Walz DUAL-OP Set of Optical Pinholes

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  • Regular price $86.00


For P700 Measurements

When leaf samples are smaller than the cross-sectional area of the measuring beam, the measuring light bypassing the leaf diminishes the P700 signal quality. To prevent the negative effects of bypassing measuring light, we offer a set of optical pinholes (DUAL-OP) to adjust the cross-sectional area of the measuring beam to the sample area.